Showing posts with label mtech. Paper publication. Show all posts
Showing posts with label mtech. Paper publication. Show all posts

Monday, June 30, 2014

PROCESS CORNERS


Process corners refer to the process inaccuracies, temperature and other parameter variations. The simulations that are used to analyze these process inaccuracies are different from each other. The corners describe the differences of a chip behavior form its nominal condition are usually supplied with the process kit and these are originally located in model libraries.

These kit contains  corner condition for the SS, FF, TT, FS, SF etc process, where these abbreviations stands for Slow NMOS-Slow PMOS, Fast NMOS-Fast PMOS, Typical NMOS-Typical PMOS, Fast NMOS-Slow PMOS, Slow NMOS-Fast PMOS etc. These corner conditions are checked with the help of EDA or simulation process and in result it describes IC behavior. It may contain the process of temperature variation and Vdd (supply voltage) variation depends on customer IC requirement. e.g. For car manufacturing company the IC should be checked for  maximum corner conditions and temperature variations otherwise  IC will not fulfill all requirement.­­­







Thursday, June 26, 2014

Levels Of IC Design


The design of integrated circuits (IC) contains the different levels of abstraction . According to the IC design standards we can study the complex circuits at following four levels.
1). Device Physics Level  2). Transistor Level  3). Architecture Level  4). System Level

1). The device physics level describes the device internal behaviour for electric field and charge.
2). Transistor level consist of a group of these devices .
3). Architectural level defines a unit of several building blocks to perform a certain functions.
3). System level consist of the set of subsystems.e.g.  ADC, DAC etc.

In conclusion  one may say that in today's IC industry above four levels are essential to achieve a high performance and low cost device. 
                                                
                                                          

Wednesday, June 25, 2014

Power dissipation in CMOS digital circuits

The growing development of CMOS logic VLSI circuits has decreased the circuit size, increased the switching speed , there is one problem associated with this technology that is known as the power dissipation . There are many researchers who are trying to decrease the power consumption of CMOS based digital circuits. The main cause of power dissipation in CMOS based VLSI circuits are divided on the basis of   its working or behavior.
There are mainly two cases of Power dissipation 1) Dynamic power dissipation 2) Static power dissipation. This dynamic power dissipation can be further divided in three parts known as switching power dissipation, short circuit power dissipation and glitching power dissipation. These can be reduced by changing the parameters of the following models:

  switching power

P switching = α Foperating.Vdd2 CL [for full output swing]

Where Foperating is operating frequency, Vdd = supply voltage, CL= Net load capacitance, α= switching activity factor of gate.
P switching = α Foperating Vdd. Vswing CL [for low voltage swing]

Short circuit power
Pshort circuit = (μCox/12) (W/L)(Vdd-2Vth)3τ Foperating
Where  τ = rise/ fall time of the input signal


The static power dissipation occurs because of two reasons: DC current and Transistor leakage current.